SRAM_TEST Project Status
Project File: sram_test.ise Current State: Programming File Generated
Module Name: top
  • Errors:
No Errors
Target Device: xc3s250e-4tq144
  • Warnings:
49 Warnings
Product Version: ISE 9.1.03i
  • Updated:
Wed Sep 5 00:33:30 2007
 
SRAM_TEST Partition Summary
No partition information was found.
 
Device Utilization Summary
Logic UtilizationUsedAvailableUtilizationNote(s)
Number of Slice Flip Flops 57 4,896 1%  
Number of 4 input LUTs 40 4,896 1%  
Logic Distribution     
Number of occupied Slices 48 2,448 1%  
    Number of Slices containing only related logic 48 48 100%  
    Number of Slices containing unrelated logic 0 48 0%  
Total Number of 4 input LUTs 74 4,896 1%  
Number used as logic 40      
Number used as a route-thru 34      
Number of bonded IOBs 30 108 27%  
    IOB Flip Flops 10      
Number of GCLKs 4 24 16%  
Number of DCMs 2 4 50%  
Total equivalent gate count for design 15,025      
Additional JTAG gate count for IOBs 1,440      
 
Performance Summary
Final Timing Score: 0 Pinout Data: Pinout Report
Routing Results: All Signals Completely Routed Clock Data: Clock Report
Timing Constraints: All Constraints Met    
 
Detailed Reports
Report NameStatusGenerated ErrorsWarningsInfos
Synthesis ReportCurrentWed Aug 22 23:24:46 2007045 Warnings0
Translation ReportCurrentWed Aug 22 23:24:54 2007002 Infos
Map ReportCurrentWed Aug 22 23:25:00 200701 Warning3 Infos
Place and Route ReportCurrentWed Aug 22 23:25:13 200702 Warnings1 Info
Static Timing ReportCurrentWed Aug 22 23:25:18 200701 Warning2 Infos
Bitgen ReportCurrentWed Aug 22 23:25:27 2007001 Info